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Data: EELS measurements for determining the oxidation of the silicon nitride membrane in LPTEM
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https://doi.org/10.11583/DTU.28917617
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posted on 2025-07-11, 12:15
authored by
Sofie Tidemand-Lichtenberg
Sofie Tidemand-Lichtenberg
,
Shima Kadkhodazadeh
Shima Kadkhodazadeh
,
Kristian Mølhave
Kristian Mølhave
<p dir="ltr">Datasets used to determine the oxidation of the silicon nitride membrane in liquid phase TEM. The oxidation of the membrane occur at high electron doses, and can influence the environment inside the liquid cell. </p>
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DOI -
Is supplement to
Electron beam oxidation of silicon nitride membranes in liquid phase transmission electron microscopy
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https://orcid.org/0000-0002-3785-4670
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Categories
Molecular imaging (incl. electron microscopy and neutron diffraction)
Keywords
TEM
beam effects
EELS
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CC BY 4.0
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